ZSX Primus II- High Performance WDXRF Wavelength Dispersive X-Ray Fluorescence Spectrometer
Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types with minimal standards.
Tube Above Optics for Superior Reliability
ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.
Low-Z Performance with Mapping and Multi-Spot Analysis
Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus II features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus II allows easy detailed investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.
SQX Fundamental Parameters with EZ-Scan Software
EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.
Features
- Analysis of elements from Be to U
- Tube above optics minimizes contamination issues
- Small footprint uses less valuable lab space
- Micro analysis to analyze samples as small as 500 µm
- 30? tube delivers superior light element performance
- Mapping feature for elemental topography/distribution
- Helium seal means the optics are always under vacuum
Specifications
| General | |
|---|---|
| Elemental coverage | 4Be through 92U |
| Optics | Wavelength dispersive, sequential, tube above |
| X-ray generator | |
| X-ray tube | End window, Rh-anode, 3kW or 4 kW, 60kV |
| HV power supply | High frequency inverter, ±0.005% stability |
| Cooling | Internal water-to-water heat exchanger |
| Spectrometer | |
| Sample changer | 48 positions standard, 96 optional |
| Sample inlet | APC automatic pressure controller |
| Maximum sample size | 51 mm (diameter) by 30 mm (high) |
| Analysis sample area | 35 mm (diameter) |
| Sample rotation speed | 30 rpm |
| Primary X-ray filters | Al, Ti, Cu and Zr |
| Beam collimators | 6 auto-selectable diameters: 35, 30, 20, 10, 1 and 0.5 mm |
| Divergence slit | 3 auto-selectable: standard, high, and course (optional) resolutions |
| Receiving slit | For SC and for F-PC detectors |
| Goniometer | θ – 2θ independent drive mechanism |
| Angular range | SC: 5-118°, F-PC: 13-148° |
| Maximum scan speed | 1400°/min (2θ) |
| Angular reproducibility | ±0.0005° |
| Continuous scan | 0.1 - 240°/min |
| Crystal changer | 10 crystals, automatic mechanism |
| Vacuum system | 2 pump high-speed system w/ (optional) powder trap |
| He flush system | Optional, with partition |
| Temperature stabilizer | 36.5°C ± 0.1°C |
| Detector systems | |
| Heavy element detector | Scintillation counter (SC) |
| Light element detector | Flow proportional counter (F-PC) |
| Attenuator | In-out automatic exchanger (1/10) |
Download the AXT Mining and Minerals Product Guide