UltraDry Compact EDS Detector – Silicon Drift X-Ray Detector
The Thermo Scientific UltraDry Compact EDS detector (Energy Dispersive X-Ray Spectrometer) is an advanced Silicon Drift Detector (SDD) that combines best-in-class collection rates with low energy performance and light element detection down to carbon for your elemental mapping needs.
The UltraDry Compact loads high performance into a small package. At the heart of the detector is the on-chip FET and proprietary preamplifier stage. This combination produces outstanding spectral performance and X-ray collection rates of up to 1,000,000 counts per second.
Other key features are the innovative window technology that enables excellent low energy performance and no need for liquid nitrogen cooling. For convenience, the UltraDry Compact mounts on the WDS port of your SEM chamber.
Complete Microanalysis System
The UltraDry Compact is part of a highly engineered, fully integrated microanalysis system, the Thermo Scientific NORAN System 7. This system features such things as:
- Template point and shoot analysis
- Standardless quantification
- Full dead-time corrected spectral imaging for elemental mapping
- Take your data anywhere facility freeing up the microscope for more data collection
- Oneclick reporting to Microsoft Word
Specifications
Integrated Operation | EDS, WDS, and EBSD operation and analysis in a fully unified software platform. |
Operating Environment | 30°C non-condensing |
Peak Shift | ±5eV peak shift (±3eV typical between 1% and 60% deadtime) from minimum to maximum count rate at a given analyser time constant. |
Phase Mapping | The NORAN System 7 allows you to identify phases during the acquisition. |
Resolution | ±5 eV resolution change (±3eV typical between 1% and 60% dead time) from minimum to maximum count rate at a given analyser time constant. |
STD Distance | 50-60mm (typical) |
Active Area | 10mm2 |
Third Party Communication | Can be integrated with third party applications. |
Analysis Automation | Acquires a spectrum at every point—useful for imaging, X-ray mapping, Linescan and advanced automated analysis. |
TOA | 30-35° (typical) |
FWHM Measured | 5.89 keV (Mn-Ka) with 10,000 counts per second. |
Input Counts | >1,000,000 |
Chemical Typing | Chemical Typing software classifies particles by matching their quantitative chemical composition to a database. |
Feature Sizing | Feature Sizing software collects the morphological and chemical characteristics of infrequently occurring particles in large area samples. |
Data Collection | Spectral imaging |
Rapid EDS Analaysis
Using the point and shoot facility on the NORAN 7 software, standardless quantitative analysis enables rapid materials identification of selected regions on a sample.
Pt 1 (wt.%) | Pt 2 (wt.%) | Pt 3 (wt.%) | |
---|---|---|---|
C-K | 2.1 | 2.2 | 1.9 |
O-K | 58.3 | 61.8 | 61.3 |
Mg-K | 0.7 | ||
Al-K | 12.6 | 1.1 | 0.5 |
Si-K | 18.3 | 6.7 | 33.9 |
K-K | 4.2 | 0.1 | 0.1 |
Co-K | 0.1 | ||
Fe-K | 3.7 | 27.0 | 2.3 |
Cu-K | 0.9 |
EDS Analysis with NORAN System 7 Spectral Imaging
The UltraDry Compact EDS detector gives you outstanding element mapping in minutes.
With Spectral Imaging, where a full EDS spectrum is stored at every pixel, you can continue to analyze the sample after it has been removed from the microscope.
NORAN System 7 tools provide several analytical methods for the best results.