Model 1051 TEM Mill – TEM Sample Preparation System
Preparation of electron transparent specimens for TEM imaging and analysis is a delicate and precise operation. The Model 1051 TEM Mill has been designed specifically for TEM sample preparation system.
Featuring a new design, the 1051 mills at low incident angles using a low-energy ion source which both minimises irradiation damage and facilitates uniform thinning of multiphasic materials such as composites and layered materials as well as preparation of cross-sectional TEM samples (XTEM).
The model 1051 TEM sample preparation solution has been designed with the user in mind. Featuring a contamination-free specimen loading system that allows easy loading and rapid transfer via a vacuum load lock, as well as an optional x-y adjustable stage and specimen viewing, the Model 1051 will help you to consistently prepare the highest quality TEM specimens.
TEM Mill Ion Source
- Two independently adjustable TrueFocus ion sources
- High energy operation for rapid milling; low energy operation for specimen polishing
- Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 10 keV)
- Ion beam spot size range from 300 ?m to 5 mm
- Independent ion source gas control
- Continuously adjustable milling angle range of -15 to +10°
- Beam current density up to 10 mA/cm2
- Milling rates in excess of 500 ?m/hour
- Easily accessible for routine maintenance
TEM Mill Specimen Stage and Chamber
- Specimen holder with x-y adjustment
- Double-sided milling to 0° without specimen shadowing
- Contamination-free sample loading
- Specimen rocking or rotation with ion beam sequencing
- Load lock designed for quick vacuum transfer of specimens
- Vacuum capsule for transferring sample to TEM under vacuum
- In situ viewing and image capture during milling
- Liquid nitrogen-cooled specimen stage
- Software controlled continuous 360° specimen rotation
- Zero sputtering of the specimen holder
Software and Controls
- Automatic and manual termination
- Software controlled ion beam energy, milling angle, specimen motion, specimen position, and process termination
- Adjustable 10-inch touch screen with a user-friendly interface for simple setup of milling parameters
- Allows for creating multi-step milling sequences including the automatic adjustment of milling angles throughout the milling process
- Automatic termination of the process by elapsed time, temperature or laser photo-detection system
- Other software features; Managing specimen data, maintenance and log files, and image storage, as well as remote access to oversee milling operations
