K-Alpha⁺ – X-Ray Photoelectron Spectrometer (XPS)

The award-winning K-Alpha⁺ is a research grade XPS spectrometer that delivers higher count rates and produces faster analyses leading to enhanced chemical detectability.

Analytical Performance

The K-Alpha⁺ is versatile and allows various analytical functions to be performed including:

Selectable area spectroscopy
Sputter depth profiling
Micro-focused monochromator
Snapshot acquisition
High-resolution chemical state spectroscopy
Insulator analysis
Quantitative chemical imaging

Software

The system also includes a range of XPS software packages to meet the exacting requirements of both experienced XPS users and those new to the technology. It has modes that automate repetitive tasks and produce reports or allows experiences users to take full control of the instrument.

The software allows the user to:

Acquire data Spectra, images, profiles and line scans
Data interpretation Elemental and chemical state identification
Data processing – Quantification, peak fitting, real-time profile display, spectrum-image manipulation, PCA, phase analysis, TFA, NLLSF, PSF removal, optical/XPS image overlays
Reporting Automated report generation and the ability to export to other software packages
Hardware control Hardware is fully controllable from the Advantage software package
Archive management The Advantage Indexer manages data files
Audit trail logging
System performance logging
Calibration Performed on demand
Full remote operation

The combination of cutting edge hardware and powerful, yet user-friendly software allows users to make the most of the monochromated XPS performance with intelligent automation and intuitive controls.

System Options

Options that can be added to the K-Alpha⁺ to extend its capabilities include:

Glove box with recirculating inert-gas atmosphere for transfer or air/moisture sensitive samples
Tilt module for ARXPS data collection

Key Features

Key features of the Thermo Scientific K-Alpha⁺ include:

Analyser 180° double focusing hemispherical analyser with 128-channel detector
X-ray source Al K? micro-focused monochromator with variable spot size (30-400µm in 5µm steps)
Ion Gun Energy range 100-4000eV
Charge Compensation Dual beam source
Sample Handling 4-axis sample stage, 60 x 60mm sample area, 20mm maximum sample thickness
Vacuum System 2x 220L/s turbo molecular pumps for entry and analysis chambers