DualSource Rapid II – Wavelength Switchable X-Ray Diffractometer (XRD)
The DualSource Rapid II is the latest addition to the Rapid II family. It features a Cu microfocus sealed beam tube and a Mo standard sealed beam tube. This combination provides the best performance for crystallographers in a wavelength switchable x-ray diffractometer.
System Advantages
- Large aperture size a 204° capture angle ensures you are collecting as much data from your crystal during an exposure reducing the number of images that need to be collected
- Low Noise the large aperture and lack of electronic noise are suited to diffuse scattering measurements in particular on small samples requiring log exposure times
- Simplicity simple design provides ease of use and enables in-field repairs if required
Key Features
Key features of the DualSource Rapid II include:
- Macromolecular structure determination
- Standard three dimensional structure determination from single crystals
- Determination of absolute structure of chiral compounds
- Complete high-resolution data for charge-density modelling
- Structure determination from very small crystals
- Diffuse scattering patterns employing long X-ray exposures
- High pressure measurements using a diamond anvil cell
- Supramolecular structures (meta-structures, often with large unit cells)
- Complete handling of twinned and modulated crystals
- Phase ID of powder samples
- Fibre diffraction patterns
