ZSX Primus III+ – Rapid Quantitative Elemental Analysis – Rigaku
Rigaku ZSX Primus III+ delivers rapid quantitative determination of major and minor atomic elements, from oxygen (O) through uranium (U), in a wide variety of sample types with minimal standards.
Tube Above Optics for Superior Reliability
ZSX Primus III+ features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.
High Precision Sample Positioning
The high precision positioning of the sample ensures that the distance between the sample surface and X-ray tube is kept constant. This is important for applications that require high precision, such as the analysis of alloys. ZSX Primus III+ performs high-precision analysis using a unique optical configuration designed to minimize errors caused by non-flat surfaces in samples such as fused beads and pressed pellets
SQX Fundamental Parameters with EZ-Scan Software
EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.
Features
- Analysis of elements from O to U
- Tube above optics minimizes contamination issues
- Small footprint uses less valuable lab space
- High precision sample positioning
- Special optics reduce errors caused by curved sample surfaces
- Software tools for statistical process control (SPC)
- Evacuation and vacuum leak rates can be optimized for throughput
Specifications
| General | |
|---|---|
| Elemental coverage | 4Be through 92U |
| Optics | Wavelength dispersive, sequential, tube above |
| X-ray generator | |
| X-ray tube | End window, Rh-anode, 3kW, 60kV |
| HV power supply | High frequency inverter, ±0.005% stability |
| Cooling | Internal water-to-water heat exchanger |
| Spectrometer | |
| Sample changer | 48 positions standard, 96 optional |
| Maximum sample size | 51 mm (diameter) by 30 mm (high) |
| Analysis sample area | 35 mm (diameter) |
| Sample rotation speed | 30 rpm |
| Primary X-ray filters | Al, Ti, Cu and Zr |
| Beam collimators | 4 auto-selectable diameters: 35, 30, 20 and 10 mm |
| Divergence slit | 3 auto-selectable: standard, high, and course (optional) resolutions |
| Receiving slit | For SC and for F-PC detectors |
| Goniometer | θ – 2θ independent drive mechanism |
| Angular range | SC: 5-118°, F-PC: 13-148° |
| Maximum scan speed | 1400°/min (2θ) |
| Angular reproducibility | ±0.0005° |
| Continuous scan | 0.1 - 240°/min |
| Crystal changer | 10 crystals, automatic mechanism |
| Vacuum system | High-speed system |
| Detector systems | |
| Heavy element detector | Scintillation counter (SC) |
| Light element detector | Flow proportional counter (F-PC) |
| Attenuator | In-out automatic exchanger (1/10) |
Download the AXT Mining and Minerals Product Guide